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HSEM-06PS

HSEM-06PS Room Temperature Variable Field Probe Bench Hall Test System can be placed 4 inch wafer samples, using porous zoning control gas adsorption fixation, can provide a variable magnetic field environment, magnetic field size ± 0.6T , can be installed 6 probe arm. External connection to other electrical instrumentation can be at room temperature on the chip, wafer and device for non-destructive electrical testing, such as current, voltage, resistance and other electrical signals under different magnetic fields.

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HSEM-15

HSEM series electromagnet Hall effect test system consists of electromagnet, Hall tester, controller, sample variable temperature options and other components. There are continuously variable magnetic field environment, can choose ± 0.8T or ± 1.5T two configurations, there are more abundant temperature options, including: room temperature, liquid nitrogen single-point, 10K-400K closed-cycle low-temperature options, room temperature-1273K high-temperature options.

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HSEM Series-LINKPHYSICS

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Shanghai：Room 502, Building 1, No. 69 Yuanfeng Road, Baoshan District, Shanghai
Beijing：Room 1011, Longguan Property Building, 118 Huilongguan West Street, Changping District, Beijing
Hefei：No.716, Building B, Liji Mansion, 91 Jinzhai Road, Shushan District, Hefei City, Anhui Province
Sichuan： 2-1-3002, Yicheng International, 139 Huajian Road, Shuangliu District, Chengdu City
Shenzhen：502A, No.15 Dayuan Industrial Zone, Pingshan 1st Road, Nanshan District, Shenzhen City, Guangdong Province

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