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HSEM-06PS
HSEM-06PS Room Temperature Variable Field Probe Bench Hall Test System can be placed 4 inch wafer samples, using porous zoning control gas adsorption fixation, can provide a variable magnetic field environment, magnetic field size ± 0.6T , can be installed 6 probe arm. External connection to other electrical instrumentation can be at room temperature on the chip, wafer and device for non-destructive electrical testing, such as current, voltage, resistance and other electrical signals under different magnetic fields.
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HSEM-15
HSEM series electromagnet Hall effect test system consists of electromagnet, Hall tester, controller, sample variable temperature options and other components. There are continuously variable magnetic field environment, can choose ± 0.8T or ± 1.5T two configurations, there are more abundant temperature options, including: room temperature, liquid nitrogen single-point, 10K-400K closed-cycle low-temperature options, room temperature-1273K high-temperature options.
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